Methothology for estimating statistical distribution characteristics of product parameters

ABSTRACT

Disclosed is method for estimating statistical distribution characteristics of product parameters. The method comprises determining n number of product parameters, which characterize a product, and m number of characteristic parameters dependent on the product parameters, determining m number of correlation functions that represent the characteristic parameters in terms of the product parameters, and obtaining inverse functions of the correlation functions that represent the product parameters in terms of the characteristic parameters. After fabricating test products to empirically determine quantitative relations between the product and characteristic parameters, the method includes measuring k number of test products and preparing measured data of the characteristic parameters. Thereafter, the method includes estimating statistical characteristics of the product parameters corresponding with a distribution of the measured data of the characteristic parameters using inverse functions of the correlation functions.

CROSS-REFERENCE TO RELATED APPLICATIONS

This U.S. non-provisional patent application claims priority under 35U.S.C. § 119 to Korean Patent Application No. 10-2006-0006873 filed onJan. 23, 2006 in the Korean Intellectual Property Office, the entirecontents of which are hereby incorporated by reference.

BACKGROUND

The present invention disclosed herein relates to methods for estimatingstatistical distribution characteristics of parameters used indeveloping products.

Qualities of products are basically dependent on design rules andprocessing conditions applied in designing and manufacturing of theproducts. With evolution of science and technology, procedures fordesigning and manufacturing industrial products have become morecomplicated. As a result, it is more difficult to analyze dependence ofproduct quality relative to design rules and processing conditions.Considering that the accuracy and rapidity of such analysis operationscontributes to shortening time-to-market for new products, it isnecessary to analyze, correctly and rapidly, correlations among thedesign rules, the processing conditions, and the product qualities.

In further detail, manufacture of semiconductor integrated circuit byhigh technology processes is a typical one having complexity of designand fabrication process and difficulty in analyzing correlationsaccording thereto. Usually, a manufacturer fabricates a semiconductorintegrated circuit with reference to a specification defining requiredstandards on electrical and structural characteristics. In the beginningof the semiconductor industry, circuit design verification according tothe specification was conducted directly by a person, but now a computersystem takes on the function of circuit design verification. Applying acomputer system having an excellent computing power to the prior casehad been quite successful. However, an operation speed and accuracy ofthe circuit design verification has been remarkably degraded as theintegration density of semiconductor circuit has increased.

Further, as semiconductor devices become smaller in dimensions, arelative ratio of processing variations, which results from proceduresof manufacturing such semiconductor devices, is increased. That is, ifhighly and lowly integrated semiconductor devices have a processingerror of the same size, the highly integrated semiconductor device hasthe increased ratio of the size of processing error to the referencesize or dimensions, compared with the lowly integrated semiconductordevice. Therefore, in a procedure of designing a semiconductorintegrated circuit, there is a rising need of considering evenvariations on manufacturing processes. Since variations in manufacturingprocesses affect a yield of a semiconductor device, it is important toestimate fluctuations on electrical characteristics of productsaccording to the variations on manufacturing processes.

In detail, considering that electrical characteristics of semiconductordevices are subject to morphological/physical parameters (hereinafter,referred to as independent parameters) such as channel length (L),device width (W), doping profile (Na or Nd), oxide thickness (T_(ox)),oxide permittivity (ε_(ox)), and channel length modulation constant (λ),it is necessary to estimate statistical distributions of the independentparameters in order to enhance yields of the semiconductor devices. In aprior approach, as shown in FIG. 1, a predetermined process ofsimulation (S2) was carried out for estimating product characteristics.The process of simulation used input data with design data (i.e., theindependent parameters) that was assumed to have normal distribution(S1). However, the normal distribution assumed for input data can beimproper because of complicated reasons, such as the aforementionedvariations on process. Incorrect input data results in inaccurateestimation to product characteristics, so it is insufficient to obtain adesired result just by assuming the distribution characteristics ofdesign data, which are used as the input data, as being arranged innormal distribution profile. Thus, it is required to correctly estimatethe product characteristics.

Nevertheless, it is generally not easy to estimate statisticaldistribution of the independent parameters. For instance, physicaltheories can be utilized to derive an equation defining correlationsbetween the independent parameters and the dependent electricalcharacteristics, but those theoretical approaches are regarded as beingsuccessful only in very restrictive cases. In other words, as generalcases, those equations are kinds of multi-variable functions. Further,since parameters of the equations are dependent on processing conditions(continuously updated for improving yields), it is mostly difficult toderive the equations through such theoretical approaches in practice. Asa result, it is hard for the prior approach to obtain proper estimationresults of statistical distribution characteristics for the independentparameters.

In other approaches to relieve such aforementioned difficulty, there aremethods of estimating statistical distribution characteristics for theindependent parameters by means of a model fitting process that needs along arithmetic procedure. However, as those methods are based on themodel fitting technique, they do not provide physical significance forcorrelations between the independent parameters and the electricalcharacteristics subject to the independent parameters, as well as takinga very long time to execute.

SUMMARY OF THE INVENTION

According to aspects of the present invention, provided is a method foranalyzing, correctly and rapidly, a correlation between independentparameters that characterize a product, and parameters subject to theindependent parameters.

According to aspects of the present invention, also provided is a methodof estimating statistical distribution characteristics, capable ofoffering understanding about physical correlations between independentand dependent parameters.

In accordance with one aspect of the present invention, provided is amethod for estimating distribution characteristics of productparameters. This method comprises determining n number of productparameters that characterize a product, determining m number ofcharacteristic parameters dependent on the product parameters,determining c m number of correlation functions that represent thecharacteristic parameters in terms of the product parameters, andobtaining inverse functions of the correlation functions that representthe product parameters in terms of the characteristic parameters. Themethod further includes fabricating test products to empiricallydetermine quantitative relations between the product parameters andcharacteristic parameters, in number of k, obtaining k numbered measureddata of the characteristic parameters by measuring k number of the testproducts. The method further includes estimating statisticalcharacteristics of the product parameters corresponding to adistribution of the measured data of the characteristic parameters usinginverse functions of the correlation functions.

The product parameters can be physical parameters representing physicalcharacteristics of the products, processing conditions for fabricatingthe products, or both, and the characteristic parameters are measurableparameters can be dependent on the product parameters.

The correlation functions can be determined using at least one ofphysical/chemical theories, a simulation technique, and a modelingtechnique based on empirical data.

Determining the correlation functions can comprise: determining designvalues of the characteristic parameters and product parameters forsatisfying required qualities of the product; and obtaining thecorrelation functions to fit the design values of the characteristicparameters and the design values of the product parameters.

Determining the correlation functions can comprise: selecting differentinput values in a predetermined number around the design values of theproduct parameters; extracting values of the characteristic parameterscorresponding to the selected input values as output data, by conductingsimulation using the selected input values as input data; and conductinga model fitting operation to determine the correlation functionsrepresenting the quantitative relations between the selected inputvalues and the values of the characteristic parameters extracted as theoutput data.

Selecting the input values can comprise utilizing at least one design ofexperiment (DOE) technique comprising D-optimal design, full factorialdesign, fractional factorial design, central composite design, andBox-Behnken design.

The model fitting operation can comprise using a response surfacemodeling (RSM) technique.

Obtaining the inverse functions of the correlation functions cancomprise: obtaining a Jacobian matrix represented as partial derivativesof the product parameters relative to the characteristic parameters;obtaining a pseudo-inverse matrix of the Jacobian matrix; and obtainingthe inverse functions of the correlation functions that represent theproduct parameters by transforming the product parameters into thecharacteristic parameters using the pseudo-inverse matrix of theJacobian matrix.

Estimating the statistical characteristics of the product parameterscomprises: obtaining k number of estimated product parameters bysubstituting the k-numbered measured data of the characteristic of theproduct parameters into the following equation: x=x₀+IJ(y−y₀), where xdenotes a matrix of the product parameters; x₀ denotes a matrix of thedesign values of the product parameters; y₀ denotes a matrix of thedesign values of the characteristic parameters; y denotes a matrix ofthe characteristic parameters; and IJ denotes an inverse matrix of theJacobian matrix.

Estimating the statistical characteristics of the product parameters cancomprise: extracting distribution data of the product parameterscorresponding to the measured data by applying the measured data of thecharacteristic parameters into the inverse functions of the correlationfunctions; and extracting statistical distribution characteristics,which comprise mean values, dispersions, and standard deviations, of theproduct parameters, from the extracted distribution data of the productparameters.

After extracting the statistical distribution characteristics of theproduct parameters, the method can further comprise: conducting asimulation using the statistical distribution characteristics of theproduct parameters as input data to estimate characteristics of theproduct, wherein the statistical distribution characteristics of theproduct parameters are obtained from the measured data of thecharacteristic parameters.

In accordance with another aspect of the present invention, provided isa method for estimating physical parameters of a semiconductor device.The method comprises: determining n number of physical parameters tocharacterize the semiconductor device; determining m number ofelectrical parameters dependent on the physical parameters; determiningm number of correlation functions that represent the electricalparameters in terms of the physical parameters; obtaining inversefunctions of the correlation functions that represent the physicalparameters in terms of the electrical parameters; fabricating testdevices to empirically determine quantitative relations between thephysical parameters and electrical parameters; obtaining k numberedmeasured data of the electrical parameters by measuring k number of thetest devices; and estimating statistical characteristics of the physicalparameters corresponding to a distribution of the measured data of theelectrical parameters using the inverse functions of the correlationfunctions.

The semiconductor device can comprise at least one or transistors,resistive elements, interconnections coupling the transistors and/orresistive elements, and insulating constructions disposed around thetransistors, the resistive elements, and the interconnections, whereinthe physical parameters are parameters representing physicalcharacteristics of at least one of the transistors, the resistiveelements, the interconnections, and the insulating constructions,wherein the electrical parameters are parameters electrically measurableand dependent on the physical parameters.

The physical parameters can comprise at least one physicalcharacteristic of the transistor comprising channel length, channelwidth, thickness of gate insulation film, thickness of gate electrode,impurity concentration of gate electrode, conductance of gate electrode,impurity concentration of channel, depth of source/drain region, andzero-bias threshold voltage, and wherein the electrical parameterscomprises at least one electrical characteristic of the transistorcomprising source/drain current, off-current, threshold voltage,breakdown voltage of gate insulation film, breakdown voltage ofsource/drain junction, and punch-through voltage.

The correlation functions can be determined using at least one ofphysical/chemical theories, a simulation technique, and a modelingtechnique based on empirical data.

Determining the correlation functions can comprise: determining designvalues of the electrical parameters and physical parameters forsatisfying required qualities of the semiconductor device; and obtainingthe correlation functions to fit the design values of the electricalparameters and the design values of the physical parameters.

Determining the correlation functions comprise: selecting differentinput values in a predetermined number around the design values of thephysical parameters; extracting values of the electrical parameterscorresponding to the selected input values as output data, by conductingsimulation using the selected input values as input data; and conductinga model fitting operation to determine the correlation functionsrepresenting the quantitative relations between the selected inputvalues and the values of the electrical parameters extracted as theoutput data.

Selecting the input values can comprise utilizing at least one design ofexperiment (DOE) technique comprising D-optimal design, full factorialdesign, fractional factorial design, central composite design, andBox-Behnken design.

The model fitting operation can comprise using a response surfacemodeling (RSM) technique.

Obtaining the inverse functions of the correlation functions comprise:obtaining a Jacobian matrix represented as partial derivatives of thephysical parameters relative to the electrical parameters; obtaining apseudo-inverse matrix of the Jacobian matrix; and obtaining the inversefunctions of the correlation functions that represent the physicalparameters by transforming the product parameters into the electricalparameters using the pseudo-inverse matrix of the Jacobian matrix.

Estimating the statistical characteristics of the physical parameterscan comprise: obtaining k-numbered estimated physical parameters bysubstituting the k-numbered measured data of the electrical parametersinto the following equation: x=x₀+IJ(y−y₀), where x denotes a matrix ofthe physical parameters; x₀ denote a matrix of the design values of thephysical parameters; y₀ denote a matrix of the design values of theelectrical parameters; y denotes a matrix of the electrical parameters;and IJ denotes an inverse matrix of the Jacobian matrix.

Estimating the statistical characteristics of the physical parameterscan comprise: extracting distribution data of the physical parameters,in correspondence with the measured data, by substituting the measureddata of the electrical parameters into the inverse functions of thecorrelation functions; and extracting statistical distributioncharacteristics, which comprise mean values, dispersions, and standarddeviations, of the physical parameters, from the extracted distributiondata of the physical parameters.

Extracting the statistical distribution characteristics of the physicalparameters, the method can further comprise: conducting a simulationusing the statistical distribution characteristics of the physicalparameters as input data to estimate characteristics of thesemiconductor device, wherein the statistical distributioncharacteristics of the physical parameters are obtained from the measuredata of the electrical parameters.

In accordance with another aspect of the invention, provided is a methodfor estimating processing parameters of a semiconductor device. Themethod comprises: determining n number of the processing parameters tocharacterize a fabrication process of the semiconductor device;determining m number of characteristic parameters dependent on theprocessing parameters; determining m number of correlation functionsthat represent the characteristic parameters in terms of the processingparameters; obtaining inverse functions of the correlation functionsthat represent the processing parameters in terms of the characteristicparameters; manufacturing test devices to empirically determinequantitative relations between the processing parameters andcharacteristic parameters; obtaining k numbered measured data of thecharacteristic parameters by measuring k number of the test devices; andestimating statistical characteristics of the processing parameterscorresponding to a distribution of the measured data of thecharacteristic parameters using inverse functions of the correlationfunctions.

Processing parameters can be processing conditions applied in thesemiconductor fabrication process, wherein the characteristic parametersare measurable characteristics dependent on the processing conditions.

The semiconductor device can comprise one or more of transistors,resistive elements, interconnections coupling the transistors and/orresistive elements, and insulating constructions disposed around thetransistors, the resistive elements, and the interconnections, whereinthe processing parameters include at least one of the processingconditions comprising temperature, duration, pressure, gas flux, andrelative compound ratio of processing gases, which are applied to atleast one of steps for fabricating the transistors, the resistiveelements, the interconnections, and the insulative constructions,wherein the characteristic parameters include at least one ofcharacteristics of the semiconductor device fabricated with reference tothe processing parameters comprising film thickness, film density, filmpermittivity, film conductivity, pattern width, tilt angle of patternsidewall, etching selection ratio, etching rate, deposition rate, andstep coverage, which is dependent on the processing conditions.

The correlation functions can be determined using at least ofphysical/chemical theories, a simulation technique, and a modelingtechnique based on empirical data.

Determining the correlation functions can comprise: determining designvalues of the characteristic parameters and processing parameters forsatisfying required qualities of the semiconductor device; and obtainingthe correlation functions to fit the design values of the characteristicparameters and the design values of the processing parameters.

Determining the correlation functions can comprise: selecting differentinput values in a predetermined number around the design values of theprocessing parameters; extracting values of the characteristicparameters corresponding to the selected input values as output data byconducting simulation using the selected input values as input data; andconducting a model fitting operation to determine the correlationfunctions representing the quantitative relations between the selectedinput values and the values of the characteristic parameters extractedas the output data.

Selecting the input values can be carried out utilizing at least onedesign of experiment (DOE) technique comprising D-optimal design, fullfactorial design, fractional factorial design, central composite design,and Box-Behnken design.

The model fitting operation can be carried out with using a responsesurface modeling (RSM) technique.

Obtaining the inverse functions of the correlation functions cancomprise: obtaining a Jacobian matrix represented as partial derivativesof the processing parameters relative to the characteristic parameters;obtaining a pseudo-inverse matrix of the Jacobian matrix; and obtainingthe inverse functions of the correlation functions that represent theprocessing parameters by transforming the product parameters into thecharacteristic parameters using the pseudo-inverse matrix of theJacobian matrix.

Estimating the statistical characteristics of the processing parameterscan comprise: obtaining k number of estimated product parameters bysubstituting the k-numbered measured data of the characteristicparameters into the following equation: x=x₀+IJ(y−y₀), where x denotes amatrix of the processing parameters; x₀ denotes a matrix of the designvalues of the processing parameters, y₀ denotes a matrix of the designvalues of the electrical parameters; y denotes a matrix of thecharacteristic parameters; and IJ denotes an inverse matrix of theJacobian matrix.

Estimating the statistical characteristics of the processing parameterscan comprise: extracting distribution data of the processing parameters,in correspondence with the measured data, by substituting the measureddata of the characteristic parameters into the inverse functions of thecorrelation functions; and extracting statistical distributioncharacteristics, which comprise mean values, dispersions, and standarddeviations, of the processing parameters, from the extracteddistribution data of the processing parameters.

After extracting the statistical distribution characteristics of theprocessing parameters, the method can further comprise: conducting asimulation using the statistical distribution characteristics of theprocessing parameters as input data to estimate characteristics of thesemiconductor device, wherein the statistical distributioncharacteristics of the processing parameters are obtained from themeasure data of the characteristic parameters.

BRIEF DESCRIPTION OF THE FIGURES

Non-limiting and non-exhaustive embodiments depicting aspects of thepresent invention will be described with reference to the followingfigures, wherein like reference numerals refer to like parts throughoutthe various figures unless otherwise specified. In the figures:

FIG. 1 is a flowchart of a prior approach for estimating characteristicsof product parameters;

FIG. 2 is a flowchart illustrating an embodiment of a method generalizedfor establishing statistical distribution characteristics of productparameters in accordance with aspects of the present invention;

FIG. 3 is a flowchart illustrating an embodiment of a method generalizedfor establishing correlation functions in accordance with aspects of thepresent invention;

FIG. 4 is a flowchart illustrating an embodiment of a method ofestimating characteristics of products in accordance with aspects of thepresent invention;

FIG. 5 is a flowchart illustrating an embodiment of a method ofestablishing correlation functions in accordance with aspects of thepresent invention;

FIG. 6 is a flowchart illustrating an embodiment of a method ofestimating statistical distribution characteristics of productparameters in accordance with aspects of the present invention;

FIG. 7 is a histogram exemplarily showing distribution characteristicsof an off-current I_(off) resulting from the embodiments above;

FIGS. 8 and 9 are a three-dimensional graph and a contour plot chart,those of which show features of joint probability density functionresulting from the embodiment of the present invention; and

FIGS. 10A, 10B, and 10C are graphs show features of joint probabilitydensity functions with characteristic parameters, I_(ds), I_(off), andV_(th), resulting from the embodiment of the present invention.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

Preferred embodiments will be described below with reference to theaccompanying drawings. The present invention can, however, be embodiedin different forms and should not be constructed as limited to theembodiments set forth herein.

FIG. 2 is a flow chart illustrating an embodiment of a method forestablishing statistical distribution characteristics of productparameters in accordance with aspects of the present invention.

Referring to FIG. 2, after selecting a product to be analyzed, productparameters x_(i) (i=1, 2, . . . , n) are established (in S10). In thisembodiment, for illustrative purposes, it will be presumed that theproduct is a semiconductor integrated circuit, but the product is notrestricted to a semiconductor integrated circuit. Namely, the presentinvention is generally adaptable to estimating statistical distributioncharacteristics of parameters for various products. Additionally, themethod of estimating statistical distribution characteristics accordingto aspects of the present invention can be used in analyzing acorrelation between design patterns and characteristics of products, anda correlation between manufacturing processes and characteristics ofproducts. With these points, the product parameters can be designconditions applied in designing the product and processing conditionsapplied in fabricating the product. An illustrative embodiment foranalyzing a correlation between the design conditions and thecharacteristics will be described again with reference to results ofcertain experiments hereinbelow.

According to the method characteristic parameters y_(j) (j=1, 2, . . . ,m) are established in relation to the product parameters x_(i) (in S20).The characteristic parameters y_(j) are selected with items representingcharacteristics of products fabricated on the basis of the productparameters x_(i). At this point, the product parameters andcharacteristic parameters, x_(i) and y_(j), can be referred to asindependent and dependent parameters, respectively.

The method then establishes correlation functions defining quantitativerelations between the product parameters and characteristic parametersx_(i) and y_(j) (in S30). Considering mutual dependence between theproduct and characteristic parameters x_(i) and y_(j), the correlationfunctions can be equations representing the characteristic parametersy_(j) in a function of the product parameters x_(i) (e.g.,y_(j)=g_(j)(x_(i)); i=1, . . . n and j=1, . . . m). Here, consideringthat the correlation functions are represented in the form of anequation, the product and characteristic parameters, x_(i) and y_(j),should be selected with parameters capable of implementing aquantitative analysis.

The correlation functions can be defined in various manners. Forinstance, FIG. 3 shows an embodiment of a method that can be used toobtain equations for correlation functions 370, which definequantitative relations between the characteristic 310 and productparameters 320, through at least one of a theoretical approach 330 basedon physics and chemistry, a simulation 340, and empirical modeling 350.In the prior art it has been very difficult to achieve the desireddefinition of correlation functions through such theoretical approaches.But such difficulties are overcome by approaching this matterselectively using simulation and empirical modeling techniques alongwith the theoretical operation, represented in decision box 360. Thesimulation 340 and empirical modeling 350 techniques are preferablycarried out for correlating the product 310 and characteristicparameters 320 with each other in a selected range (i.e., around apredetermined design value), which will be described again in detailhereinafter.

Returning to the method of FIG. 2, inverse functions of the correlationfunctions are obtained, representing the product parameters as afunction of the characteristic parameters (in S40). As the correlationfunctions are multi-variable functions formed of the product parameters,it is generally not easy to obtain the inverse functions. But, themethod of estimating statistical distribution characteristics inaccordance with aspects of the present invention comprises steps forobtaining a Jacobian matrix represented in the form of a partialderivative of the product parameters relative to the characteristicparameters, and further includes obtaining a pseudo-inverse matrix ofthe Jacobian matrix. Accordingly, the method can be utilized toeffectively obtain the inverse function. This method will be furtherdetailed with reference to FIG. 6.

Using the inverse functions of the correlation functions, the methodestimates distribution characteristics of the product parameters (inS70). The estimated distribution characteristics of the productparameters (in S80), as shown in FIG. 4, are used as input data forsimulation (in S90) to estimate product characteristics and statisticaldistribution thereof (in S100). Here, the estimated distributioncharacteristics of the product parameters can be obtained from dataevaluated by practically measuring test products fabricated on the basisof the product parameters. For this operation, the method comprisessteps for fabricating the test products with reference to the productparameters (in S50) and measuring characteristics of the test products(in S60).

FIG. 5 is a flowchart illustrating an embodiment of a method forestablishing the correlation functions in accordance with the presentinvention.

Referring to FIG. 5, first, predetermined design values relative to theproduct parameters and the characteristic parameters are selected (inS110). In the case of a semiconductor integrated circuit, the procedureof selecting such design values can include selecting 0.06 μm for achannel length L_(ch) of a transistor and selecting 0.5V for a thresholdvoltage V_(th) of the transistor. In these embodiments, the channellength corresponds to one of the product parameters because it expressesa structural characteristic of the transistor. Also, the thresholdvoltage corresponds to another one of the product parameters because itexpresses a structural characteristic of the transistor. Further, as theselected dimensions, i.e., L_(ch)=0.06 μm and V_(th)=0.5V, are arrangedto satisfy characteristics required for the semiconductor integratedcircuit, they are actual ‘design values’.

Returning to FIG. 5, a plurality of simulation input values are selectedaround the design values of the product parameters (in S120). Accordingto this embodiment, the simulation input values can be selected through“Design of Experiment” (DOE), a method that is well known in this field(in 200). For instance, the DOE can comprise one or more well-knowntechniques such as D-optimal design, full factorial design, fractionalfactorial design, central composite design, and Box-Behnken, asexamples. As the simulation input values are selected around the designvalues of the product parameters, they express permissible variations onthe process in fabricating the products. Subsequently, an operation ofsimulation is carried out to analyze quantitative correlations betweenthe product parameters and characteristic parameters, with reference tothe selected input values (in S130), resulting in output values of thesimulation.

These output values of the simulation are used in a model fittingprocess (in S140) for obtaining the correlation functions representingquantitative correlations between the input and output values. Accordingto the present embodiment, the model fitting process S140 can employresponse surface modeling (RSM) in 300, as an example. As thecorrelation functions obtained from the aforementioned procedure resultfrom the simulation in S130 with values around the input values thereof,they express variations of the characteristic parameters, relative tothe design values, which correspond to fluctuations of the productparameters generated during a fabrication process of the products.

FIG. 6 is a flowchart illustrating an embodiment of a method ofestimating statistical distribution characteristics of productparameters, in further detail, according to aspects of the presentinvention. Now described is a method of estimating the inverse functionsof the correlation functions and the distribution characteristics of theproduct parameters using the inverse functions, with reference to FIG.6.

Referring to FIG. 6, as aforementioned, the method includes obtainingthe correlation functions defining relations between the product andcharacteristic parameters (in S30). These correlation functions can bedefined as follows.

$\quad\begin{matrix}\begin{matrix}{y_{1} = {g_{1}\left( {x_{1},x_{2},\ldots\mspace{14mu},x_{n}} \right)}} \\\vdots \\{y_{m} = {g_{m}\left( {x_{1},x_{2},\ldots\mspace{14mu},x_{n}} \right)}}\end{matrix} & \left\lbrack {{Equation}\mspace{14mu} 1} \right\rbrack\end{matrix}$

Here, as aforementioned with reference to FIG. 5, these correlationfunctions can be obtained by way of simulation with peripheral valuesaround the design values of the product parameters.

A Jacobian matrix is obtained that is defined as a partial derivative ofthe product parameters to the characteristic parameters (in S32). ThisJacobian matrix can be given as follows.

$\begin{matrix}{J = \frac{\partial\left( {y_{1},\ldots\mspace{14mu},y_{m}} \right)}{\partial\left( {x_{1},\ldots\mspace{14mu},x_{n}} \right)}} & \left\lbrack {{Equation}\mspace{14mu} 2} \right\rbrack\end{matrix}$

Since the Jacobian matrix depends on the product parameters relative tothe characteristic parameters, the Jacobian matrix can be generallyobtained from the dependence among the parameters. As a result, the thisembodiment is useful even in the case that it is difficult to extractthe correlation functions.

According to the method, the inverse or pseudo-inverse matrix of theJacobian matrix (S34) is obtained. As a general matter, if there is amatrix B satisfying the following matrix equation for a predeterminedsquare matrix A, the matrix B is the inverse matrix of the matrix A.AB=BA=I(I: identity matrix)  [Equation 3]

But if the matrix A is not a square matrix, its inverse matrix cannot begenerally determined. However, a pseudo-inverse matrix can be defined asa generalized form of an inverse matrix. That is, if a predetermined m×nmatrix A is a kind of skinny matrix (i.e., m≧n) of a full rank type, itspseudo-inverse matrix A^(†) is given as follows.A ^(†)=(A ^(T) A)⁻¹ A ^(T)  [Equation 4]

Here, A^(T) represents a transpose matrix of the matrix A and (A^(T)A)⁻¹represents the inverse matrix of the matrix (A^(T)A).

Further, if a predetermined m×n matrix A is a kind of fat matrix (i.e.,m≦n) of a full rank type, its pseudo-inverse matrix A^(†) is given asfollows.A ^(†) =A ^(T)(A ^(T) A)⁻¹  [Equation 5]

Referring to the inverse or pseudo-inverse matrix of the Jacobianmatrix, referred to as IJ, the method includes obtaining linearequations representing the product parameters x_(i) with thecharacteristic parameters y_(j) (in S40). Namely, assuming that a matrixrepresenting design values of the product parameters is x₀ and a matrixrepresenting design values of the characteristic parameters is y₀, thematrix x of the product parameters can be transformed into the matrix yof the characteristic parameters by using the inverse or pseudo-inversematrix IJ of the Jacobian matrix, as shown in the following equation.x=x ₀ +IJ(y−y ₀)  [Equation 6]

Thereafter, the test products are fabricated with reference to theproduct parameters (in S50). Namely, the test products are manufacturedby using the design values of the product parameters of the design data.Then, data is measured from k number of the test products, so as to takemeasured data for characteristics of the test products (in S60). As aresult, the measured data are formed of k×n values. These measured datacorrespond with the characteristic parameters. Distributioncharacteristic data of the product parameters are extracted by applyingthe measured data into the matrix y of Equation 6. In accordance withaspects of the present invention, the extracted distributioncharacteristic data of the product parameters are obtained from thepractical measured data. Then, statistical distribution characteristicsof the product parameters, comprising one or more of mean values,dispersion values, and standard deviations, are extracted usingstatistical analysis with the distribution characteristic data.

Such statistical distribution characteristics of the product parametersare reused as input data (in S80) for estimating characteristics of theproduct, as shown in FIG. 4, as discussed above. Here, it can beunderstood that while the conventional case regards the distributioncharacteristics of the product parameters as being normalized, thepresent embodiment utilizes the statistical distribution characteristicsof the product parameters that are extracted from the practical measuredata. The estimation for product characteristics comprisesdistributional features thereof, examined empirically. Further, theestimation for product characteristics, according to aspects of thepresent invention, is able to provide more evolved accuracy than theconventional approach. This advanced accuracy in estimating the productcharacteristics (in S100), according to aspect of the present invention,will be explained with respect to FIGS. 7 to 10 showing embodimentspracticed in the context of semiconductor integrated circuits.

The methodology for estimating product parameters in accordance withaspects of the present invention is applicable to analyzing correlationsbetween design conditions and electrical characteristics ofsemiconductor integrated circuits. As a result, in these embodiments,the product parameters correspond with the design conditions definingphysical/structural characteristics of the semiconductor integratedcircuits. In detail, as the semiconductor integrated circuit isgenerally comprised of transistors, resistive elements, interconnectionslinking them together, and insulative constructions disposed among them,the product parameters can be selected to represent physicalcharacteristics of at least one of the structural components. Forinstance, the product parameter can be at least one of physicalcharacteristics comprising channel length, channel width, thickness ofgate insulation film, impurity concentration of gate electrode,conductance of gate electrode, impurity concentration of the channel,depth of the source/drain region, zero-bias threshold voltage, and soforth.

Additionally, the characteristic parameters can be characteristics thatare electrically measurable from the semiconductor integrated circuit,depending on the product parameters. For example, the characteristicparameter can be at least one of electrical characteristics comprisingdrain-to-source current, off-current, threshold voltage, breakdownvoltage of gate insulation film, breakdown and punch-through voltages ofsource/drain junction, and so forth. But, the product and characteristicparameters can be selected with various items, without being restrictiveto the exemplarily physical and electrical characteristics mentionedabove.

The method for estimating statistical distribution characteristics,according to aspects of the present invention, was experimentallyapplied to a single NMOS device fabricated by means of a 68-nmprocessing technique. In this exemplary experiment, the productparameters for estimation were selected for the effective channel lengthL_(eff), the oxide thickness T_(ox), and the zero-bias threshold voltageV_(th0), while the characteristic parameters to be measured wereselected in the drain-source current I_(ds), the off-current I_(off),and the threshold voltage V_(th). Therefore, the product andcharacteristic parameters can be summarized in vector components asfollows.

$\begin{matrix}{x = {{\begin{bmatrix}L_{eff} \\T_{ox} \\V_{th0}\end{bmatrix}\mspace{20mu}{and}\mspace{14mu} y} = \begin{bmatrix}I_{ds} \\{\log\; I_{off}} \\V_{th}\end{bmatrix}}} & \left\lbrack {{Equation}\mspace{20mu} 7} \right\rbrack\end{matrix}$

In Equation 7, as the off-current I_(off) is exponentially dependent onthe parameters L_(off), T_(ox), and V_(th0), it is represented in theform of a logarithm for easy estimation. Here, the correlation functionsrepresenting the quantitative relations among the parameters can beobtained by the methods aforementioned with reference to FIGS. 3, 5, and6, and the inverse functions thereof can be obtained by the method shownin FIG. 6.

Then, after fabricating an NMOS device with the dimensions of W/L=2.64μm/0.17 μm for the product parameters, I_(ds), d_(off), and V_(th) aremeasured from the NMOS device, which was done 500 times. The NMOS devicewas fabricated by means of the 68-nm processing technique. And, usingthe method shown in FIG. 6, it analyzed distribution characteristics ofthe measured characteristic parameters. FIG. 7 is a histogramexemplarily showing the distribution characteristics of the off-currentI_(off) obtained by measuring the NMOS device.

Thereafter, the statistical characteristics are estimated, such as meanvalues and standard deviations of L_(eff), T_(ox), and V_(th0), usingstatistical analysis. Hereinafter, Tables 1 and 2, and FIGS. 8 and 9will show results of such estimation.

TABLE 1 Design Standard deviation/ value Mean Standard deviation AverageL_(eff) [μm] 0.17 0.1655 0.0170 10.02% T_(ox) [nm] 1.0 1.0840 0.155415.54% V_(th0) [V] 4.7 4.6930 0.0768 1.63%

Table 1 shows, as an example, mean values and standard deviations ofL_(eff), T_(ox), and V_(th0). According to Table 1, while V_(th0) isrelatively small in variation, T_(ox) is considerably larger invariation. Therefore, the methodology in accordance with aspects of thepresent invention is able to analyze correlations among the parameters,as well as estimating variations of the parameters.

TABLE 2 L_(eff) T_(ox) V_(th0) L_(eff) 1 0.6024 −0.8361 T_(ox) 0.6024 1−0.6026 V_(th0) −0.8361 −0.6026 1

Table 2 represents correlative degrees among the design parametersL_(eff), T_(ox), and V_(th0). Referring to Table 2, the parametersL_(eff) and V_(th0) are strongly correlated with each other in negativeproportions. In other words, if the parameter L_(eff) increases, itraises the probability of reducing the parameter V_(th0) in value. Thereverse is also true. These features of the correlations can be seenfrom the three-dimensional graph and contour plot, each depicted inFIGS. 8 and 9, which show the pattern of joint probability densityfunctions between the parameters L_(eff) and V_(th0).

Next, to obtain the electrical characteristics (i.e., I_(ds), I_(off),and V_(th)), a first simulation was carried out with the statisticaldistribution characteristics of the design parameters that are generatedfrom the measured data (refer to FIG. 4). The first simulation wasexecuted by means of the “Monte Carlo” technique. Additionally, withoutconsidering correlations among the parameters, second simulation wascarried out in the same manner. Table 3 hereinafter shows results of thefirst and second simulation processes.

TABLE 3 Mean μ_(M) (μ_(S) − μ_(M))/μ_(M) (μ_(iS) − μ_(M))/μ_(M) I_(ds)[mA] 0.9204 1.25% 1.78% log I_(off) −19.8001 −0.21% −0.10% V_(th) [V]0.4925 −0.07% 0.23% Standard deviation σ_(iS) σ_(S)/σ_(M) σ_(iS)/σ_(M)I_(ds) [mA] 0.0983 1.0782 1.9526 log I_(off) 1.0368 0.9949 2.0288 V_(th)[V] 0.0523 1.0818 1.8065Here, μ_(M), μ_(S), and μ_(iS) represent mean values of the measuredvalues, and the first and second simulations, respectively, while σ_(M),σ_(S), and σ_(iS) represent standard deviations of the measured values,and the first and second simulations.

Referring to Table 3, errors between the mean values of the first andsecond simulations were less than 2% thereof. Considering correlationsof the parameters, the standard deviations of the first simulation werenear to those of measured values of the parameters (σ_(S)/σ_(M)˜1).Otherwise, without considering correlations of the parameters, thestandard deviations of the first simulation were much different fromthose of measured values of the parameters (σ_(S)/σ_(M)˜2). From theseresults, it can be understood that there is a need for considering thecorrelations of the parameters. This necessity for the correlations ofthe parameters becomes more apparent through FIGS. 10A through 10Cdepicting the joint probability density functions in the seconddimensions. FIGS. 10A, 10B, and 10C are graphs showing features of theprobability density functions with the characteristic parameters,I_(ds), I_(off), and V_(th), resulting from the embodiments above.

Referring to FIGS. 10A through 10C, while there is a remarkable gap inthe probability density functions between the values of the secondsimulation and the practical measured values, the probability densityfunctions between the values of the first simulation and the measuredvalues are approximate to each other. Such a difference between thefirst and second simulations arises from correlations of the parameters,showing the necessity for considering the correlations of theparameters. For this reason, a methodology for enabling the analysis ofthe correlations of the parameters, according to aspects of the presentinvention, is helpful in improving the performance of estimating productcharacteristics.

Consequently, the methodology is advantageous for providing usefulresults, even for the probability density functions and the jointprobability density functions, as well as the statisticalcharacteristics such as the mean values and standard deviations.

The methodology, as aforementioned, is also applicable to analyzingcorrelations among the characteristics of the semiconductor devicefabricated by referring to the processing conditions and parameters ofthe semiconductor integrated circuit. In this embodiment, the productparameters correspond with the processing conditions applied to theprocedure of manufacturing the semiconductor integrated circuit. Indetail, the product parameters can be at least one of the processingconditions, such as temperature, duration, pressure, gas flux, relativecompound ratio of processing gases, and so forth, those of which areapplied to at least one of the processing steps for fabricatingtransistors, resistive elements, interconnections, and insulativeconstructions.

Further, the characteristic parameters can be items measurablequantitatively, depending on the product parameters. For instance, thecharacteristic parameter can be one of the characteristics related tothe processing conditions, such film thickness, film density, filmpermittivity, film conductivity, pattern width, tilt angle of patternsidewall, etching selection ratio, etching rate, deposition rate, andstep coverage, for the semiconductor device fabricated with reference tothe processing conditions. But, the product and characteristicparameters can be variously selected in accordance with necessities ofthe device, without being restrictive to the exemplary processingconditions and characteristic items herein.

In this embodiment, methods for obtaining the correlation functions andtheir inverse functions, and methods for extracting the statisticaldistribution characteristics of the product parameters therewith can becarried out in the same manners as used in the above embodiments, sowill not be described in further detail.

In summary, in accordance with aspects of the present invention,provided is a methodology generalized for estimating and analyzing thecorrelations among the product parameters, which defines a feature of aproduct, and the characteristic parameters obtained from the productparameters. For this, the methodology comprises a step of, aftergenerating correlation functions that represent the characteristicparameters in the form of the product parameters, obtaining the inversefunctions of the correlation functions. The inverse functions of thecorrelation functions can be obtained by way of generating the Jacobianmatrix and the inverse matrix thereof. Using the inverse functions ofthe correlation functions, results measured from the test productsfabricated with reference to the product parameters are statisticallyanalyzed to extract data for the statistical distributioncharacteristics of the product parameters. As the extracted data arebased on values measured from a fabricated product, aspects of thepresent invention are available for: (1) analyzing characteristics ofthe product, which immediately reflect errors and variations on process;and further (2) analyzing physical meanings of data (i.e., correlationsamong the parameters) different from the conventional case.

Moreover, according to aspects of the present invention, analysis of theparameters correctly and quickly is provided. Namely, as aforementioned,since the items practically measured can be easily obtained by way ofelectrical means, the time it takes for measurement is shorter. Whilethe conventional case is needed to conduct a dissipative process tosolve nonlinear equations for such an analysis, in accordance withaspects of the present invention, an operation time for obtaining theresults of analysis is significantly shortened, because it is based on asimpler procedure for executing multiplications of matrices. As anexample, in the case of analyzing the product and characteristicparameters each in of 10 instances, while the conventional method forsolving the nonlinear equations would take several days to obtainresults of analysis, in accordance with aspects of the present inventionthe desired results of analysis are obtained in about one second.Specifically, in accordance with aspects of the present invention,generation of effective results of analysis are achieved through themethod of obtaining the pseudo-inverse matrices, thereby offering highlygeneralized methodology applicable to varieties of industrialapplications.

The above-disclosed subject matter is to be considered illustrative, andnot restrictive, and the appended claims are intended to cover all suchmodifications, enhancements, and other embodiments, which fall withinthe true spirit and scope of the present invention. Thus, to the maximumextent allowed by law, the scope of the present invention is to bedetermined by the broadest permissible interpretation of the followingclaims and their equivalents, and shall not be restricted or limited bythe foregoing detailed description.

1. A method for estimating distribution characteristics of productparameters, the method comprising: determining n number of productparameters that characterize a product; determining m number ofcharacteristic parameters dependent on the product parameters;determining m number of correlation functions that represent thecharacteristic parameters in terms of the product parameters; obtaininginverse functions of the correlation functions that represent theproduct parameters in terms of the characteristic parameters;fabricating test products to empirically determine quantitativerelations between the product parameters and characteristic parameters;obtaining k numbered measured data of the characteristic parameters bymeasuring k number of the test products; and estimating statisticalcharacteristics of the product parameters corresponding to adistribution of the measured data of the characteristic parameters usingthe inverse functions of the correlation functions.
 2. The method as setforth in claim 1, wherein the product parameters are physical parametersrepresenting physical characteristics of the products, processingconditions for fabricating the product, or both, wherein thecharacteristic parameters are measurable parameters dependent on theproduct parameters.
 3. The method as set forth in claim 1, wherein thecorrelation functions are determined using at least one ofphysical/chemical theories, a simulation technique, and a modelingtechnique based on empirical data.
 4. The method as set forth in claim1, wherein determining the correlation functions comprises: determiningdesign values of the characteristic parameters and product parametersfor satisfying required qualities of the product; and obtaining thecorrelation functions to fit the design values of the characteristicparameters and the design values of the product parameters.
 5. Themethod as set forth in claim 4, wherein determining the correlationfunctions comprises: selecting different input values in a predeterminednumber around the design values of the product parameters; extractingvalues of the characteristic parameters corresponding to the selectedinput values as output data, by conducting simulation using the selectedinput values as input data; and conducting a model fitting operation todetermine the correlation functions representing the quantitativerelations between the selected input values and the values of thecharacteristic parameters extracted as the output data.
 6. The method asset forth in claim 5, wherein selecting the input values comprisesutilizing at least one design of experiment (DOE) technique comprisingD-optimal design, full factorial design, fractional factorial design,central composite design, and Box-Behnken design.
 7. The method as setforth in claim 5, wherein the model fitting operation comprises using aresponse surface modeling (RSM) technique.
 8. The method as set forth inclaim 4, wherein obtaining the inverse functions of the correlationfunctions comprises: obtaining a Jacobian matrix represented as partialderivatives of the product parameters relative to the characteristicparameters; obtaining a pseudo-inverse matrix of the Jacobian matrix;and obtaining the inverse functions of the correlation functions thatrepresent the product parameters by transforming the product parametersinto the characteristic parameters using the pseudo-inverse matrix ofthe Jacobian matrix.
 9. The method as set forth in claim 8, whereinestimating the statistical characteristics of the product parameterscomprises: obtaining k number of estimated product parameters bysubstituting the k-numbered measured data of the characteristic of theproduct parameters into the following equation:x=x ₀ +IJ(y−y ₀), where x denotes a matrix of the product parameters; x₀denotes a matrix of the design values of the product parameters; y₀denotes a matrix of the design values of the characteristic parameters;y denotes a matrix of the characteristic parameters; and IJ denotes aninverse matrix of the Jacobian matrix.
 10. The method as set forth inclaim 1, wherein estimating the statistical characteristics of theproduct parameters comprises: extracting distribution data of theproduct parameters corresponding to the measured data by applying themeasured data of the characteristic parameters into the inversefunctions of the correlation functions; and extracting statisticaldistribution characteristics, which comprise mean values, dispersions,and standard deviations, of the product parameters, from the extracteddistribution data of the product parameters.
 11. The method as set forthin claim 10, after extracting the statistical distributioncharacteristics of the product parameters, the method furthercomprising: conducting a simulation using the statistical distributioncharacteristics of the product parameters as input data to estimatecharacteristics of the product, wherein the statistical distributioncharacteristics of the product parameters are obtained from the measureddata of the characteristic parameters.
 12. A method for estimatingphysical parameters of a semiconductor device, the method comprising:determining n number of physical parameters to characterize thesemiconductor device; determining m number of electrical parametersdependent on the physical parameters; determining m number ofcorrelation functions that represent the electrical parameters in termsof the physical parameters; obtaining inverse functions of thecorrelation functions that represent the physical parameters in terms ofthe electrical parameters; fabricating test devices to empiricallydetermine quantitative relations between the physical parameters andelectrical parameters; obtaining k numbered measured data of theelectrical parameters by measuring k number of the test devices; andestimating statistical characteristics of the physical parameterscorresponding to a distribution of the measured data of the electricalparameters using the inverse functions of the correlation functions. 13.The method as set forth in claim 12, wherein the semiconductor devicecomprises at least one or transistors, resistive elements,interconnections coupling the transistors and/or resistive elements, andinsulating constructions disposed around the transistors, the resistiveelements, and the interconnections, wherein the physical parameters areparameters representing physical characteristics of at least one of thetransistors, the resistive elements, the interconnections, and theinsulating constructions, wherein the electrical parameters areparameters electrically measurable and dependent on the physicalparameters.
 14. The method as set forth in claim 13, wherein thephysical parameters comprise at least one physical characteristic of thetransistor comprising channel length, channel width, thickness of gateinsulation film, thickness of gate electrode, impurity concentration ofgate electrode, conductance of gate electrode, impurity concentration ofchannel, depth of source/drain region, and zero-bias threshold voltage,and wherein the electrical parameters comprises at least one electricalcharacteristic of the transistor comprising source/drain current,off-current, threshold voltage, breakdown voltage of gate insulationfilm, breakdown voltage of source/drain junction, and punch-throughvoltage.
 15. The method as set forth in claim 12, wherein thecorrelation functions are determined using at least one ofphysical/chemical theories, a simulation technique, and a modelingtechnique based on empirical data.
 16. The method as set forth in claim12, wherein determining the correlation functions comprises: determiningdesign values of the electrical parameters and physical parameters forsatisfying required qualities of the semiconductor device; and obtainingthe correlation functions to fit the design values of the electricalparameters and the design values of the physical parameters.
 17. Themethod as set forth in claim 16, wherein determining the correlationfunctions comprises: selecting different input values in a predeterminednumber around the design values of the physical parameters; extractingvalues of the electrical parameters corresponding to the selected inputvalues as output data, by conducting simulation using the selected inputvalues as input data; and conducting a model fitting operation todetermine the correlation functions representing the quantitativerelations between the selected input values and the values of theelectrical parameters extracted as the output data.
 18. The method asset forth in claim 17, wherein selecting the input values comprisesutilizing at least one design of experiment (DOE) technique comprisingD-optimal design, full factorial design, fractional factorial design,central composite design, and Box-Behnken design.
 19. The method as setforth in claim 17, wherein the model fitting operation comprises using aresponse surface modeling (RSM) technique.
 20. The method as set forthin claim 16, wherein obtaining the inverse functions of the correlationfunctions comprises: obtaining a Jacobian matrix represented as partialderivatives of the physical parameters relative to the electricalparameters; obtaining a pseudo-inverse matrix of the Jacobian matrix;and obtaining the inverse functions of the correlation functions thatrepresent the physical parameters by transforming the product parametersinto the electrical parameters using the pseudo-inverse matrix of theJacobian matrix.
 21. The method as set forth in claim 20, whereinestimating the statistical characteristics of the physical parameterscomprises: obtaining k-numbered estimated physical parameters bysubstituting the k-numbered measured data of the electrical parametersinto the following equation:x=x ₀ +IJ(y−y ₀), where x denotes a matrix of the physical parameters;x₀ denote a matrix of the design values of the physical parameters; y₀denote a matrix of the design values of the electrical parameters; ydenotes a matrix of the electrical parameters; and IJ denotes an inversematrix of the Jacobian matrix.
 22. The method as set forth in claim 12,wherein estimating the statistical characteristics of the physicalparameters comprises: extracting distribution data of the physicalparameters, in correspondence with the measured data, by substitutingthe measured data of the electrical parameters into the inversefunctions of the correlation functions; and extracting statisticaldistribution characteristics, which comprise mean values, dispersions,and standard deviations, of the physical parameters, from the extracteddistribution data of the physical parameters.
 23. The method as setforth in claim 22, after extracting the statistical distributioncharacteristics of the physical parameters, the method furthercomprising: conducting a simulation using the statistical distributioncharacteristics of the physical parameters as input data to estimatecharacteristics of the semiconductor device, wherein the statisticaldistribution characteristics of the physical parameters are obtainedfrom the measure data of the electrical parameters.
 24. A method forestimating processing parameters of a semiconductor device, the methodcomprising: determining n number of the processing parameters tocharacterize a fabrication process of the semiconductor device;determining m number of characteristic parameters dependent on theprocessing parameters; determining m number of correlation functionsthat represent the characteristic parameters in terms of the processingparameters; obtaining inverse functions of the correlation functionsthat represent the processing parameters in terms of the characteristicparameters; manufacturing test devices to empirically determinequantitative relations between the processing parameters andcharacteristic parameters; obtaining k numbered measured data of thecharacteristic parameters by measuring k number of the test devices; andestimating statistical characteristics of the processing parameterscorresponding to a distribution of the measured data of thecharacteristic parameters using inverse functions of the correlationfunctions.
 25. The method as set forth in claim 24, wherein theprocessing parameters are processing conditions applied in thesemiconductor fabrication process, wherein the characteristic parametersare measurable characteristics dependent on the processing conditions.26. The method as set forth in claim 24, wherein the semiconductordevice comprises one or more of transistors, resistive elements,interconnections coupling the transistors and/or resistive elements, andinsulating constructions disposed around the transistors, the resistiveelements, and the interconnections, wherein the processing parametersinclude at least one of the processing conditions comprisingtemperature, duration, pressure, gas flux, and relative compound ratioof processing gases, which are applied to at least one of steps forfabricating the transistors, the resistive elements, theinterconnections, and the insulative constructions, wherein thecharacteristic parameters include at least one of characteristics of thesemiconductor device fabricated with reference to the processingparameters comprising film thickness, film density, film permittivity,film conductivity, pattern width, tilt angle of pattern sidewall,etching selection ratio, etching rate, deposition rate, and stepcoverage, which is dependent on the processing conditions.
 27. Themethod as set forth in claim 24, wherein the correlation functions aredetermined using at least of physical/chemical theories, a simulationtechnique, and a modeling technique based on empirical data.
 28. Themethod as set forth in claim 24, wherein determining the correlationfunctions comprises: determining design values of the characteristicparameters and processing parameters for satisfying required qualitiesof the semiconductor device; and obtaining the correlation functions tofit the design values of the characteristic parameters and the designvalues of the processing parameters.
 29. The method as set forth inclaim 28, wherein determining the correlation functions comprises:selecting different input values in a predetermined number around thedesign values of the processing parameters; extracting values of thecharacteristic parameters corresponding to the selected input values asoutput data by conducting simulation using the selected input values asinput data; and conducting a model fitting operation to determine thecorrelation functions representing the quantitative relations betweenthe selected input values and the values of the characteristicparameters extracted as the output data.
 30. The method as set forth inclaim 29, wherein selecting the input values is carried out utilizing atleast one design of experiment (DOE) technique comprising D-optimaldesign, full factorial design, fractional factorial design, centralcomposite design, and Box-Behnken design.
 31. The method as set forth inclaim 29, wherein the model fitting operation is carried out with usinga response surface modeling (RSM) technique.
 32. The method as set forthin claim 28, wherein obtaining the inverse functions of the correlationfunctions comprises: obtaining a Jacobian matrix represented as partialderivatives of the processing parameters relative to the characteristicparameters; obtaining a pseudo-inverse matrix of the Jacobian matrix;and obtaining the inverse functions of the correlation functions thatrepresent the processing parameters by transforming the productparameters into the characteristic parameters using the pseudo-inversematrix of the Jacobian matrix.
 33. The method as set forth in claim 32,wherein estimating the statistical characteristics of the processingparameters comprises: obtaining k number of estimated product parametersby substituting the k-numbered measured data of the characteristicparameters into the following equation:x=x ₀ +IJ(y−y ₀), where x denotes a matrix of the processing parameters;x₀ denotes a matrix of the design values of the processing parameters,y₀ denotes a matrix of the design values of the electrical parameters; ydenotes a matrix of the characteristic parameters; and IJ denotes aninverse matrix of the Jacobian matrix.
 34. The method as set forth inclaim 24, wherein estimating the statistical characteristics of theprocessing parameters comprises: extracting distribution data of theprocessing parameters, in correspondence with the measured data, bysubstituting the measured data of the characteristic parameters into theinverse functions of the correlation functions; and extractingstatistical distribution characteristics, which comprise mean values,dispersions, and standard deviations, of the processing parameters, fromthe extracted distribution data of the processing parameters.
 35. Themethod as set forth in claim 34, after extracting the statisticaldistribution characteristics of the processing parameters, the methodfurther comprising: conducting a simulation using the statisticaldistribution characteristics of the processing parameters as input datato estimate characteristics of the semiconductor device, wherein thestatistical distribution characteristics of the processing parametersare obtained from the measure data of the characteristic parameters.